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(ISSN: 2306-8515, e-ISSN 1726-5479) |
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Editor-in-Chief:
Professor Sergey Y. Yurish, Phone: +34 696067716 (Europe), fax: +34 93 4011989 E-mail: editor@sensorsportal.com
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Editors for Western Europe Meijer, Gerard C.M., Delft University of Technology, The Netherlands Ferrari, Vittorio, Universitá di Brescia, Italy
Editors for North America Datskos, Panos G., Oak Ridge National Laboratory, USA Fabien, J. Josse, Marquette University, USA Katz, Evgeny, Clarkson University, USA
Editor for South America Costa-Felix, Rodrigo, Inmetro, Brazil |
Editor for Eastern Europe Anatoly Sachenko, Ternopil National Economic University, UA
Editors for Asia Ohyama, Shinji, Tokyo Institute of Technology, Japan Zhengbing, Hu, Huazhong University of Science and Technology, China
Editor for Asia-Pacific Mukhopadhyay, Subhas, Massey University, New Zealand
Editor for Africa Maki K.Habib, American University in Cairo, Egypt |
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Editorial Board: |
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Abdul Rahim, Ruzairi, Universiti Teknologi, Malaysia Abramchuk, George, Measuring Technology & Advanced Applications, Canada Ascoli, Giorgio, George Mason University, USA Atalay, Selcuk, Inonu University, Turkey Atghiaee, Ahmad, University of Tehran, Iran Augutis, Vygantas, Kaunas University of Technology, Lithuani Ayesh, Aladdin, De Montfort University, UK Baliga, Shankar, B., General Monitors, USA Basu, Sukumar, Jadavpur University, India Bousbia-Salah, Mounir, University of Annaba, Algeria Bouvet, Marcel, University of Burgundy, France Campanella, Luigi, University La Sapienza, Italy Carvalho, Vitor, Minho University, Portugal Changhai, Ru, Harbin Engineering University, China Chen Wei, Hefei University of Technology, China Cheng-Ta, Chiang, National Chia-Yi University, Taiwan Chung, Wen-Yaw, Chung Yuan Christian University, Taiwan Cortes, Camilo A., Universidad Nacional de Colombia, Colombia D'Amico, Arnaldo, Università di Tor Vergata, Italy De Stefano, Luca, Institute for Microelectronics and Microsystem, Italy Ding, Jianning, Changzhou University, China Djordjevich, Alexandar, City University of Hong Kong, Hong Kong Donato, Nicola, University of Messina, Italy Dong, Feng, Tianjin University, China Erkmen, Aydan M., Middle East Technical University, Turkey Gaura, Elena, Coventry University, UK Gole, James, Georgia Institute of Technology, USA Gong, Hao, National University of Singapore, Singapore Gonzalez de la Rosa, Juan Jose, University of Cadiz, Spain Guillet, Bruno, University of Caen, France Hadjiloucas, Sillas, The University of Reading, UK Hui, David, University of New Orleans, USA Jaffrezic-Renault, Nicole, Jaffrezic-Renault, Nicole, Claude Bernard University Lyon 1, France Jamil, Mohammad, Qatar University, Qatar Kaniusas, Eugenijus, Vienna University of Technology, Austria Kim, Min Young, Kyungpook National University, Korea Kumar, Arun, University of Delaware, USA Lay-Ekuakille, Aime, University of Lecce, Italy Li, Si, GE Global Research Center, USA Lin, Paul, Cleveland State University, USA Liu, Aihua, Chinese Academy of Sciences, China |
Muhammad Naufal, Mansor, University Malaysia Perlis, Malaysia Marquez, Alfredo, Centro de Investigacion en Materiales Avanzados, Mexico Mishra, Vivekanand, National Institute of Technology, India Moghavvemi, Mahmoud, University of Malaya, Malaysia Morello, Rosario, University "Mediterranea" of Reggio Calabria, Italy Mulla, Imtiaz Sirajuddin, National Chemical Laboratory, Pune, India Nabok, Aleksey, Sheffield Hallam University, UK Neshkova, Milka, Bulgarian Academy of Sciences, Bulgaria Passaro, Vittorio M. N., Politecnico di Bari, Italy Penza, Michele, ENEA, Italy Pereira, Jose Miguel, Instituto Politecnico de Setebal, Portugal Pogacnik, Lea, University of Ljubljana, Slovenia Pullini, Daniele, Centro Ricerche FIAT, Italy Reig, Candid, University of Valencia, Spain Restivo, Maria Teresa, University of Porto, Portugal Rodríguez Martínez, Angel, Universidad Politécnica de Cataluña, Spain Sadana, Ajit, University of Mississippi, USA Sadeghian Marnani, Hamed, TU Delft, The Netherlands Sapozhnikova, Ksenia, D. I. Mendeleyev Institute for Metrology, Russia Singhal, Subodh Kumar, National Physical Laboratory, India Shah, Kriyang, La Trobe University, Australia Shi, Wendian, California Institute of Technology, USA Shmaliy, Yuriy, Guanajuato University, Mexico Song, Xu, An Yang Normal University, China Srivastava, Arvind K., LightField, Corp, USA Stefanescu, Dan Mihai, Romanian Measurement Society, Romania Sumriddetchkajorn, Sarun, National Electronics and Computer Technology Center, Thailand Sun, Zhiqiang, Central South University, China Sysoev, Victor, Saratov State Technical University, Russia Thirunavukkarasu, I., Manipal University Karnataka, India Tianxing, Chu, Research Center for Surveying & Mapping, Beijing, China Wang, Jiangping, Xian Shiyou University, China Vazquez, Carmen, Universidad Carlos III Madrid, Spain Xue, Ning, Agiltron, Inc., USA Yang, Dongfang, National Research Council, Canada Yang, Shuang-Hua, Loughborough University, UK Yaping Dan, Harvard University, USA Zakaria, Zulkarnay, University Malaysia Perlis, Malaysia Zhang, Weiping, Shanghai Jiao Tong University, China Zhang, Wenming, Shanghai Jiao Tong University, China |
Sensors & Transducers Journal (ISSN 1726-5479) is a peer review international journal published monthly by International Frequency Sensor Association (IFSA). Available in both: print and electronic (pdf) formats.
Copyright © 2013 by International Frequency Sensor Association. All rights reserved.
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1999 - 2013 Copyright ©, International Frequency Sensor Association (IFSA). All Rights Reserved.
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