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Vol. 142, No. 7, July 2012, pp. 1-9

 

Bullet

 

Research in Nanothermometry. Part 6. Metrology of Raman Thermometer with Universal Calibration Artifacts

 

Bohdan STADNYK, Svyatoslav YATSYSHYN, Oleh SEHEDA

National University Lviv Polytechnic,

Institute of Computer Technologies, Automation and Metrology,

Bandera str. 12, Lviv, 79013, Ukraine

Tel.: +38-0322-37-50-89

E-mail: slav.yat@gmail.com

 

 

Received: 10 July 2012   /Accepted: 25 July 2012   /Published: 31 July 2012

Digital Sensors and Sensor Sysstems

 

Abstract: Current status, capabilities and limitations of Raman techniques and instruments of nanothermometry have been driven by emerging industrial measurement requirements. Issues of standardization, traceability, errors and uncertainty of the temperature measurement development are discussed in this paper.

 

Keywords: Raman thermometry, Nanometrology, Error, Uncertainty

 

 

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All Parts of Research in Nanothermometry Series of Articles:

 

1) Part 1. Temperature of Micro- and Nano- sized Objects

2) Part 2. Methodical Error Problem of Contact Thermometry

3) Part 3. Characteristics of the Thermometers with Liquid- and Solid-phase Sensitive Elements

4) Part 4. Amorphous Alloys of Thermo-resistive Thermometry

5) Part 5. Noise Thermometry and Nature of Substance

6) Part 6. Metrology of Raman Thermometer with Universal Calibration Artifacts

7) Part 7. Ultrasonic Thermometer Based on Nanostructured Thermometric Substance

8) Part 8. Summary

 

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