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Vol. 152, No. 5, May 2013, pp. 164-168

 

Bullet

 

Development of Noise Measurements. Part 3. Passive Method of Electronic Elements Quality Characterization
 
Yuriy BOBALO, Zenoviy KOLODIY, Bohdan STADNYK, Svyatoslav YATSYSHYN

National University Lviv Polytechnic, Institute of Computer Technologies, Automation and Metrology, Bandera str.12, Lviv, 79013, Ukraine

Tel.: +38-0322-37-50-89

E-mail: slav.yat@gmail.com

 

 

Received: 29 April 2013   /Accepted: 15 May 2013   /Published: 27 May 2013

Digital Sensors and Sensor Sysstems

 

Abstract: Proper electrical noise research based on estimation of electronic element structure defectiveness and resistor layer electroconductivity by use of the determined noise parameters is suggested in the article. Low-reliable elements are expected to be revealed with the help of proper noise power parameters. The appropriate examples of experimental parameter determination and defectiveness evaluation are notified.

 

Keywords: Electronic element, Relaxation constant, Electrical noise power

 

 

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