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Vol. 161, Issue 12, December 2013, pp. 162-169




IGBT Open-Circuit Fault Diagnosis Method Based on KPCA and LS-SVM
Xiaodong Yang, Chonglin Wang, Liping Shi, Zhenglong Xia

School of Information and Electrical Engineering China University of Mining and Technology, NanHu School Area China University of Mining and Technology, QuanShan District Xuzhou City JiangSu Prov., 221116, China
Tel.: +86-13775890411, fax: +86-051661886377
E-mail: 24661883@qq.com


Received: 18 September 2013   /Accepted: 22 November 2013   /Published: 30 December 2013

Digital Sensors and Sensor Sysstems


Abstract: A new fault diagnosis method is proposed in this paper to overcome the shortcomings of the traditional methods for insulated gate bipolar transistor (IGBT) open-circuit fault diagnosis such as long time need and sensitive to load change. An experiment platform of the 660 V H-bridge static synchronous compensator (STATCOM) is built to test the proposed method. For the H-bridge structure is easy to realize the capacitor voltage balance, the average value of the three phase capacitor voltage is selected as the original signal to avoid the misdiagnosis of load change. The features of the original signal are extracted by using the theory of wavelet packet transform. Dimensionality reduction method based on kernel principal component analysis (KPCA) is chosen to improve the diagnosis speed. Finally, the fault classifier is constructed via the least squares support vector machine (LS-SVM). The test results show that the method has good accuracy and real-time performance.


Keywords: IGBT, Fault diagnosis, Wavelet packet transform, KPCA, LS-SVM.


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