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Vol. 186, Issue 3, March 2015, pp. 12-17

 

Bullet

 

Metrological Array of Cyber-Physical Systems. Part 2.Checked Instrument
Based on Quantum Resistance Standard
 

Bohdan STADNYK, Svyatoslav YATSYSHYN, Halyna FEDORCHUK

Lviv Polytechnic National University, Institute of Computer Technologies, Automation and Metrology, Bandera str.12, Lviv, 79013, Ukraine
Tel.: +38-0322-37-50-89

E-mail: slav.yat@gmail.com

 

Received: 13 November 2014 /Accepted: 27 February 2015 /Published: 31 March 2015

Digital Sensors and Sensor Sysstems

 

Abstract: The reference measure of electrical resistance as collaborating element can be embedded in appropriate component of Cyber-Physical System. Whereas this measure made on the basis of inverse of conductance quantum is installed in such System, the latter could reach exclusive precision and provide high quality products manufacturing. The article considers the problems with transferring the measure’s value to measuring instruments and validation of gauged resistances.

 

Keywords: Cyber-Physical System, Quantum resistance standard, Embedded measure, Checked measuring instrument, Hamon network.

 

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