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Vol. 189, Issue 6, June 2015, pp. 107-115

 

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Metrological Array of Cyber-Physical Systems. Part 7. Additive Error Correction for Measuring Instrument
 

Yuriy YATSUK, Mykola MykyYchuk, Roman YANOVYCH, Vasyl YATSUK

National University Lviv Polytechnic, Institute of Computer Technologies, Automation and Metrology, Bandera str. 12, Lviv, 79013, Ukraine
Tel.: +38-0322-37-50-89

E-mail: yatsuk.vasyl@gmail.com

 

Received: 1 May 2015 /Accepted: 1 June 2015 /Published: 30 June 2015

Digital Sensors and Sensor Sysstems

 

Abstract: Since during design it is impossible to use the uncertainty approach because the measurement results are still absent and as noted the error approach that can be successfully applied taking as true the nominal value of instruments transformation function. Limiting possibilities of additive error correction of measuring instruments for Cyber-Physical Systems are studied basing on general and special methods of measurement. Principles of measuring circuit maximal symmetry and its minimal reconfiguration are proposed for measurement or/and calibration. It is theoretically justified for the variety of correction methods that minimum additive error of measuring instruments exists under considering the real equivalent parameters of input electronic switches. Terms of self-calibrating and verification the measuring instruments in place are studied.

 

Keywords: Cyber-Physical System, Metrological assurance, Additive error correction, Measuring transducer, Data acquisition system, Commutation elements error parameters.

 

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