bullet Sensors & Transducers Journal

    (ISSN 1726- 5479)


2008 e-Impact Factor

25 Top Downloaded Articles

Journal Subscription 2011

Editorial Calendar 2011

Submit an Article

Editorial Board

Current Issue

Sensors & Transducers journal's cover

Sensors & Transducers Journal 2009

Sensors & Transducers Journal 2008

Sensors & Transducers Journal 2007

2000-2002 S&T e-Digest Contents

2003 S&T e-Digest Contents

2004 S&T e-Digest Contents

2005 S&T e-Digest Contents

2006 S&T e-Digest Contents


Best Articles 2009




Vol. 9, Special Issue, December 2010, pp.223-232



Effect of Firing Temperature on the Composition and Structural Parameters
of Screen Printed ZrO2 Thick Film Sensors



1 Thin and Thick film Laboratory, Dept. of Electronics M. S. G.College,

Malegaon Camp 423105, Dist. Nashik, Maharashtra, India

2 L. V. H. College, Panchavati,
Nashik 422003, Maharashtra, India

*E-mail: sunilbapupatil@gmail.com



Received: 27 September 2010   /Accepted: 30 November 2010   /Published: 30 December 2010


Abstract: The compositional, morphological and structural properties of ZrO2 thick films prepared by a standard screen printing method and fired between 800 oC to 1000 oC for 2 hours in an air atmosphere. The material characterization was done using X-ray energy dispersive analysis (EDX), X-ray diffraction (XRD) and a scanning electron microscope (SEM). The deposited films were polycrystalline in nature having the monoclinic, tetragonal- cubic structure with a preferred orientation along the (111) plane. The result shows that the mass % of Zr was found to be 79.10, 82.14 and 82.04 % for firing temperatures of 800, 900 and 1000 0C respectively may be due to the release of excess oxygen. The effect of the firing temperature on structural parameters such as the crystallite size, percentage of phases, texture coefficient, RMSmicrostrain, dislocation density and stacking fault probability have been studied. The results indicate that grain growth can be increased by increasing the firing temperature which is responsible for decreasing the RMSmicrostrain and dislocation density in ZrO2 thick films. The stacking fault probability remains constant for all firing temperatures. The crystallite size changes from 25.71 nm to 30.80 nm with respect to the increase in the firing temperature.


Keywords: ZrO2, Thick films, SEM, XRD


Acrobat reader logo Click <here> or title of paper to download the full pages article (1.84 Mb)






1999 - 2010 Copyright , International Frequency Sensor Association (IFSA). All Rights Reserved.

Home - News - Links - Archives - Tools - Standardization - Patents - Marketplace - Projects - Wish List - Subscribe - Search - Membership - Submit Press Release - Twitter

 Members Area -Sensors Portal -Training Courses - S&T Digest - For advertisers - Bookstore - Forums - Polls - Sensor Jobs - e-Shop - Site Map - Video