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Vol. 14-1, Special Issue, March 2012, pp.48-64

 

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Uncooled Infrared Imaging Market to 2016

Top-Level Simulation of a Smart-Bolometer Using VHDL Modeling

 

Matthieu DENOUAL and * Patrick ATTIA

GREYC-ENSICAEN, University of Caen Basse Normandie

Caen, France

* NXP Semiconductors, Colombelles, France

E-mail: mdenoual@greyc.ensicaen.fr, patrick.attia@nxp.com

 

 

Received: 14 November 2011   /Accepted: 20 December 2011   /Published: 12 March 2012

Digital Sensors and Sensor Sysstems

 

Abstract: An event-driven modeling technique in standard VHDL is presented in this paper for the high level simulation of a resistive bolometer operating in closed-loop mode and implementing smart functions. The closed-loop mode operation is achieved by the capacitively coupled electrical substitution technique. The event-driven VHDL modeling technique is successfully applied to behavioral modeling and simulation of such a multi-physics system involving optical, thermal and electronics mechanisms. The modeling technique allows the high level simulations for the development and validation of the smart functions algorithms of the future integrated smart-device.

 

Keywords: Top simulation, Standard VHDL, Smart sensor, Bolometer

 

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