Bullet Sensors & Transducers e-Digest, Vol. 134, Issue 11, November 2011: Product News

    (ISSN 1726-5479)

 

 

Editorial Calendar 2011

Editorial Board

Submit an Article or Press Release

10 Top Sensors Products of 2010

Top 25 Downloaded Article

Sensors & Transducers Journal 2010

Journal Subscription

TriNano logo

 

 

Submit Press Release

2000-2002 S&T e-Digest Contents

2003 S&T e-Digest Contents

2004 S&T e-Digest Contents

2005 S&T e-Digest Contents

2006 S&T e-Digest Contents

2007 S&T e-Digest Contents

2008 S&T e-Digest Contents

2009 S&T e-Digest Contents


 

 

CMMs with Nanometer Uncertainty

 

 

TriNano is a new nano/micro CMM to measure objects with sub-millimeter features in three dimensions and with nanometer uncertainty. Current micro CMMs comply with the Abbe principle in 2D or even in 3D, which is a preferred method to reach 3D nanometer uncertainty. Most of these CMMs are the result of academic research, in which the challenge is to achieve the lowest uncertainty over a large measurement range. This resulted in technologically advanced, but expensive systems.

 

Within the precision manufacturing industry a large measurement range often is not the most important factor. Most objects (or their molds) have dimensions of a few centimeters (lenses, watch base plates, small gears, etc.) and fit in a match box. From now on, a cost effective device is available to measure these items in true 3D (including sidewalls, steep slopes and undercuts) with nanometer uncertainty.

 

 

Working principle

 

In order to reach nanometer uncertainty while keeping the device cost efficient, a new working principle has been developed. This principle employs a moving work piece table and a stationary probe. The table moves in three directions by means of three identical linear translation stages. These stages are positioned orthogonally and in parallel (like a tripod). On each linear stage, the scale of an optical linear encoder is mounted. At the point of intersection of the measurement axes of these encoders the probe tip is located. As the orientation of the encoder scale does not vary with respect to the probe, the TriNano complies with the Abbe principle over its entire measurement range.

 

Besides the obvious cost savings when manufacturing three identical axis, this configuration enables fast measurements through its superior dynamical behavior. Furthermore, complying with the Abbe principle in 3D greatly reduces non repeatable errors and enables a TriNano N100 to reach a 3D uncertainty of 100 nanometer over its entire measuring range. Therefore, TriNano is an optimal solution in terms of cost price, speed and versatility for measurements on small features requiring 3D nanometer uncertainty.

 

 

 

 

 

Contact:

 

Ernst Treffers

Director Business Development

Xpress Precision Engineering B.V.

Tel.: +31 402366160

E-mail: ernst.treffers@xpresspe.com

CMMs with Nanometer Uncertainty

 

 

 

Handbook of Laboratory Measurements

 

 

Back to S&T e-Digest page

 


1999 - 2011 Copyright , International Frequency Sensor Association (IFSA). All Rights Reserved.