Research in Nanothermometry. Part 6. Metrology of Raman Thermometer with Universal Calibration Artifacts

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Vol. 142, No. 7, July 2012, pp. 1-9

Research in Nanothermometry. Part 6. Metrology of Raman Thermometer with Universal Calibration Artifacts

Bohdan STADNYK, Svyatoslav YATSYSHYN, Oleh SEHEDA

National University Lviv Polytechnic,

Institute of Computer Technologies, Automation and Metrology,

Bandera str. 12, Lviv, 79013, Ukraine

Tel.: +38-0322-37-50-89

E-mail: slav.yat@gmail.com

Received: 10 July 2012 /Accepted: 25 July 2012 /Published: 31 July 2012

Abstract: Current status, capabilities and limitations of Raman techniques and instruments of nanothermometry have been driven by emerging industrial measurement requirements. Issues of standardization, traceability, errors and uncertainty of the temperature measurement development are discussed in this paper.

Keywords: Raman thermometry, Nanometrology, Error, Uncertainty

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All Parts of Research in Nanothermometry Series of Articles:

1) Part 1. Temperature of Micro- and Nano- sized Objects

2) Part 2. Methodical Error Problem of Contact Thermometry

3) Part 3. Characteristics of the Thermometers with Liquid- and Solid-phase Sensitive Elements

4) Part 4. Amorphous Alloys of Thermo-resistive Thermometry

5) Part 5. Noise Thermometry and Nature of Substance

6) Part 6. Metrology of Raman Thermometer with Universal Calibration Artifacts

7) Part 7. Ultrasonic Thermometer Based on Nanostructured Thermometric Substance

8) Part 8. Summary

Buy all 8 articles only for 60 $ US:

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