Vol. 88, Issue 2, February 2008, pp.59-65

A Dew Point Meter Comprising a Nanoporous Thin Film Alumina Humidity Sensor with a Linearizing Capacitance Measuring Electronics

Dilip Kumar Ghara, Debdulal Saha and Kamalendu Sengupta*

Sensor and Actuator Division, Central Glass & Ceramic Research Institute,

Jadavpur, Kolkata-700 032, India

*E-mail: kamalendusengupta@yahoo.co.in, dilipghara@gmail.com

Received: 6 December 2007   /Accepted: 22 February 2008   /Published: 26 February 2008

Abstract: A novel trace moisture analyzer is presented comprising a capacitive nanoporous film of metal oxide sensor and electronics. The change in capacity of the sensor is due to absorption of water vapor by the pores. A simple capacitance measuring electronics is developed which can detect any change in capacitance and correlates to ambient humidity. The circuit can minimize the parasitic earth capacitance. The non linear response of the sensor is linearized with a micro-controller linearizing circuit. The experimental result shows a resolution of -4°C DP and accuracy within 2%.

Keywords: Porous α-Al₂O₃, Micro controller, Trace moisture sensor, Thin film

  Click <here> or title of paper to download the full pages article (627 K)

1999 - 2008 Copyright ©, International Frequency Sensor Association (IFSA). All Rights Reserved.

Home - News - Links - Archives - Tools - Standardization - Patents - Marketplace - Projects - Wish List - Subscribe - Search - e-Shop - Membership

 Members Area -Sensors Portal -Training Courses - S&T Digest - For advertisers - Bookstore - Forums - Polls - Sensor Jobs - Site Map