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Vol. 206, Issue 11, November 2016, pp. 43-51




Microscopy Techniques for Topography Image Acquisition of Marks on Cartridge Cases

1 Milan Navrátil, Vojtěch Křesálek, Adam Kouteckỳ, 2 Zdenĕk Maláník

1 Department of electronics and measurements, Faculty of applied informatics, Tomas Bata University in Zlín, 76005, Zlín, Czech Republic
2 Department of Security Engineering, Faculty of applied informatics, Tomas Bata University in Zlín, 76005, Zlín, Czech Republic
1 Tel.: +420 576035283, fax: +420576035279

E-mail: navratil@fai.utb.cz


Received: 25 July 2016 /Accepted: 30 September 2016 /Published: 30 November 2016

Digital Sensors and Sensor Sysstems


Abstract: Despite very high importance of tool mark analysis in criminalistics domain, the image acquisition and comparison of tool marks remains a difficult and time-consuming effort. This work deals with description of selected microscopy techniques applied to examination of marks on the surface of fired cartridge cases, specifically on marks after firing pin. They are represented by 3-D topography images (scanning probe microscopy and laser scanning confocal microscopy) and 2-D images (scanning electron microscopy and light microscopy in bright field).


Keywords: Microscopy, Scanning probe, Confocal, Firing pin, Cartridge case, Marks, Topography.


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This work is licensed under a Creative Commons 4.0 International License


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