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Vol. 6, Special Issue, August 2009, pp.43-56





Estimation of Back-Surface Flaw Depth by Laminated Piezoelectric Highpolymer Film



Department of Energy Conversion Science,

Graduate School of Energy Science, Kyoto University

Kyoto, 606-8501, Japan

Tel./fax: +81-(0)75-753-5247

E-mail: matumoto@energy.kyoto-u.ac.jp



Received: 10 July 2009   /Accepted: 31 July 2009   /Published: 10 August 2009


Abstract: Piezoelectric thin films have been used to visualize back surface flaws in plates. If the plate with a surface flaw is deformed, the strain distribution appears on the other surface reflecting the location and the shape of the flaw. Such surface strain distribution can be transformed into the electric potential distribution on the piezoelectric film mounted on the plate surface. This paper deals with a NDE technique to estimate the depth of a back-surface flaw from the electric potential distribution on a laminated piezoelectric thin film. It is experimentally verified that the flaw depth can be exactly estimated by the peak height of the electric potential distribution.


Keywords: piezoelectricity, polyvinylidene fluoride (PVDF), NDE, flaw detection, sizing technique


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